Showing items 1 - 2 of 2

High useful yield and isotopic analysis of uranium by resonance ionization mass spectrometry

- Savina, Michael R., Isselhardt, Brett H., Kucher, Andrew, Trappitsch, Reto, King, Bruce V., Ruddle, David, Gopa, Raja, Hutcheon, Ian

Ion microscopy with resonant ionization mass spectrometry: time-of-flight depth profiling with improved isotopic precision

- Pellin, Michael J., Veryovkin, Igor V., Levine, Jonathan, Zinovev, Alexander, Davis, Andrew M., Stephan, Thomas, Tripa, C. Emil, King, Bruce V., Savina, Michael R.

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